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In Situ TEM: Theory and Applications
Book chapter   Peer reviewed

In Situ TEM: Theory and Applications

Kun Zheng, Yihua Gao, Xuedong Bai, Renchao Che, Ze Zhang, Xiaodong Han, Yoshio Bando, Shize Yang, Enge Wang and Qi Cao
Progress in Nanoscale Characterization and Manipulation, pp.381-477
Springer Tracts in Modern Physics, Springer Singapore
01/01/2018
DOI: https://doi.org/10.1007/978-981-13-0454-5_7

Abstract

Transmission electron microscope (TEM) is one of the most powerful techniques to obtain the microstructure of materials. Equipped with energy dispersive X-ray (EDX) and electron energy loss spectroscopy (EELS), not only crystallographic structures but also chemical information at nano-scale, atomic scale and even sub-angstrom scale can be obtained.

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