Abstract
A sparsity-regularized Born iterative method (BIM) is proposed for efficiently reconstructing two-dimensional piecewise-continuous inhomogeneous dielectric profiles. Such profiles are typically not spatially sparse, which reduces the efficiency of the sparsity-promoting regularization. To overcome this problem, scattered fields are represented in terms of the spatial derivative of the dielectric profile and reconstruction is carried out over samples of the dielectric profile's derivative. Then, like the conventional BIM, the nonlinear problem is iteratively converted into a sequence of linear problems (in derivative samples) and sparsity constraint is enforced on each linear problem using the thresholded Landweber iterations. Numerical results, which demonstrate the efficiency and accuracy of the proposed method in reconstructing piecewise-continuous dielectric profiles, are presented.