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A VLSI system to speedup the measurement of the system frequency: SMART CONNECTIVITY: INTEGRATING MEASUREMENT AND CONTROL
Conference proceeding

A VLSI system to speedup the measurement of the system frequency: SMART CONNECTIVITY: INTEGRATING MEASUREMENT AND CONTROL

M A Alturaigi and IEEE
IMTC/2000: PROCEEDINGS OF THE 17TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, pp.947-950
IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, PROCEEDINGS
01/01/2000

Abstract

Engineering Engineering, Electrical & Electronic Instruments & Instrumentation Science & Technology Technology

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