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A Very Deep Transfer Learning Model for Vehicle Damage Detection and Localization
Conference proceeding

A Very Deep Transfer Learning Model for Vehicle Damage Detection and Localization

Najmeddine Dhieb, Hakim Ghazzai, Hichem Besbes, Yehia Massoud and IEEE
31ST INTERNATIONAL CONFERENCE ON MICROELECTRONICS (IEEE ICM 2019), pp.158-161
International Conference on Microelectronics-ICM
01/01/2019

Abstract

Engineering Engineering, Electrical & Electronic Nanoscience & Nanotechnology Science & Technology Science & Technology - Other Topics Technology

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