A combination of FD-TD and Prony's methods for analyzing microwave integrated circuits

W.L. Ko; R. Mittra

doi:10.1109/MWSYM.1991.147179

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Conference proceeding

A combination of FD-TD and Prony's methods for analyzing microwave integrated circuits

W.L. Ko and R. Mittra

1991 IEEE MTT-S International Microwave Symposium Digest, Vol.3, pp.999-1002 vol.3

1991

DOI: https://doi.org/10.1109/MWSYM.1991.147179

Abstract

Circuit analysis

Extrapolation

Frequency domain analysis

Integrated circuit modeling

Microwave generation

Microwave integrated circuits

Microwave theory and techniques

Sampling methods

Scattering parameters

Transient analysis

It is demonstrated that, in applying the FD-TD (finite-difference time-domain) technique to analyze microwave integrated circuits, the long FD-TD time record required for generating accurate frequency-domain scattering parameters can be extrapolated from a relatively short FD-TD time record by using Prony's method. As shown by comparison with the direct FD-TD generated results, the approach using the combination of FD-TD and Prony's methods achieves the same accuracy with a time record computed over a much shorter time.< >

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Title: A combination of FD-TD and Prony's methods for analyzing microwave integrated circuits
Creators - without role: W.L. Ko - Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA
R. Mittra
Publication Details: 1991 IEEE MTT-S International Microwave Symposium Digest, Vol.3, pp.999-1002 vol.3
Publisher: IEEE
Identifiers: 9936051208331
Academic Unit: King Abdulaziz University
Language: English
Resource Type: Conference proceeding