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A novel statistical approach for chaos detection in Chua's circuit
Conference proceeding

A novel statistical approach for chaos detection in Chua's circuit

T.J. Maayah, M.A. Khasawneh, L.M. Khadra and IEEE
Proceedings of Third International Conference on Electronics, Circuits, and Systems, Vol.2, pp.808-811 vol.2
1996

Abstract

Chaos Circuit testing Error analysis Histograms Performance evaluation Random number generation Random processes State-space methods Statistical analysis Statistics

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