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An Analysis of Potentially Imprecise Class Labels Using a Fuzzy Similarity Measure
Conference proceeding

An Analysis of Potentially Imprecise Class Labels Using a Fuzzy Similarity Measure

Nick J. Pizzi, Witold Pedrycz and IEEE
2008 IEEE INTERNATIONAL CONFERENCE ON FUZZY SYSTEMS, VOLS 1-5, pp.667-672
IEEE International Conference on Fuzzy Systems
01/01/2008

Abstract

Computer Science Computer Science, Artificial Intelligence Engineering Engineering, Electrical & Electronic Science & Technology Technology

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