Abstract
The analog to digital converter (ADC) is an essential part of measurement, communications and processing systems. ADC modeling is a rich trend in the ADC research areas. High temperature applications have witnessed a real growth in last years. The motivation of this article is to describe an appropriate choice of the ADC modeling approach for high temperature ranges. The context of high temperature electronics systems is briefly described here and allows us to understand the challenges of such modeling. Comparing most known techniques enables us to make a suitable modeling choice for high temperature. An appropriate method for modeling was presented.