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Analysis of Fourier ptychographic microscopy with half reduced images
Conference proceeding

Analysis of Fourier ptychographic microscopy with half reduced images

Ao Zhou, Ni Chen and Guohai Situ
2017 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTOELECTRONIC IMAGING/SPECTROSCOPY AND SIGNAL PROCESSING TECHNOLOGY, Vol.10620, pp.1062011-1062011-6
Proceedings of SPIE
01/01/2017

Abstract

Optics Physical Sciences Science & Technology

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