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Analysis of the Reliability of a Subset of Change Metrics for Defect Prediction
Conference proceeding

Analysis of the Reliability of a Subset of Change Metrics for Defect Prediction

Raimund Moser, Witold Pedrycz, Giancarlo Succi and ACM
ESEM'08: PROCEEDINGS OF THE 2008 ACM-IEEE INTERNATIONAL SYMPOSIUM ON EMPIRICAL SOFTWARE ENGINEERING AND MEASUREMENT, pp.309-311
01/01/2008

Abstract

Computer Science Computer Science, Software Engineering Science & Technology Technology

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