Abstract
The deposition of one monolayer of silicon on a Ag(111) substrate induces the formation of silicene structures exhibiting different ordered phases, including a (2 root 3x2 root 3)R30 degrees, a (4 x 4) and a (root 13x root 13)R13.9 degrees superstructures. In this paper we focus on the (2 root 3x root 3)R30 degrees phase. Using a combination of scanning tunneling microscopy and LEED observations, we show that this phase corresponds to a 11 degrees rotation of the silicene sheet relative to the substrate orientation.