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Attosecond electron streaking with enhanced energy resolution
Conference proceeding

Attosecond electron streaking with enhanced energy resolution

A Guggenmos, A Akil, M Schaffer, M Ossiander, A M Azzeer, M Schultze, F Krausz and U Kleineberg
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Conference Proceedings, p.1
01/01/2016

Abstract

Dynamic tests Electro-optics Energy resolution Spectral resolution
Conference Title: 2016 Conference on Lasers and Electro-Optics (CLEO) Conference Start Date: 2016, June 5 Conference End Date: 2016, June 10 Conference Location: San Jose, CA, USA We demonstrate an electron streaking measurement combining sub-femtosecond temporal and sub-2 eV spectral resolution utilizing a narrow-band multilayer mirror at 112 eV. This enables time-resolved attosecond experiments investigating dynamics in semiconductors and other small-bandgap materials.

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