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Automatic BRAM Testing for Robust Dynamic Voltage Scaling for FPGAs
Conference proceeding

Automatic BRAM Testing for Robust Dynamic Voltage Scaling for FPGAs

Ibrahim Ahmed, Shuze Zhao, James Meijers, Olivier Trescases, Vaughn Betz and IEEE
2018 28TH INTERNATIONAL CONFERENCE ON FIELD PROGRAMMABLE LOGIC AND APPLICATIONS (FPL), pp.68-75
International Conference on Field Programmable and Logic Applications
01/01/2018

Abstract

Computer Science Computer Science, Hardware & Architecture Computer Science, Software Engineering Science & Technology Technology

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