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Automatic Epileptic Tendency Screening using Statistical Features of MEG Data and SVM
Conference proceeding

Automatic Epileptic Tendency Screening using Statistical Features of MEG Data and SVM

Turky N. Alotaiby, Saud R. Alrshoud, Saleh A. Alshebeili, Majed H. Alhumaid and IEEE
2019 INTERNATIONAL CONFERENCE ON ELECTRICAL AND COMPUTING TECHNOLOGIES AND APPLICATIONS (ICECTA)
01/01/2019

Abstract

Computer Science Computer Science, Interdisciplinary Applications Computer Science, Theory & Methods Engineering Engineering, Electrical & Electronic Science & Technology Technology

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