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Broadband and Accurate Material Characterization of 3D Manufactured RF Structures
Conference proceeding

Broadband and Accurate Material Characterization of 3D Manufactured RF Structures

K. Alhassoon, Y. Malallah, A. Sarnaik, C. Kolwalkar, D. N. Kumar, A. S. Daryoush and IEEE
2018 IEEE MTT-S INTERNATIONAL MICROWAVE WORKSHOP SERIES ON ADVANCED MATERIALS AND PROCESSES FOR RF AND THZ APPLICATIONS (IMWS-AMP)
01/01/2018

Abstract

Engineering Engineering, Electrical & Electronic Science & Technology Technology Telecommunications

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