Characterization of thick epitaxial GaAs layers for X-ray detection

Conference proceeding

H Samic, G C Sun, V Donchev, N X Nghia, M Gandouzi, M Zazoui, J C Bourgoin, H El-Abbassi, S Rath and P J Sellin

11/07/2002

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Title: Characterization of thick epitaxial GaAs layers for X-ray detection
Creators - without role: H Samic
G C Sun
V Donchev
N X Nghia
M Gandouzi
M Zazoui
J C Bourgoin
H El-Abbassi
S Rath
P J Sellin
Identifiers: 9932433108331
Academic Unit: University Ha'il
Resource Type: Conference proceeding