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Comparing Low Coherence Interferometry with conventional methods of measuring paper roughness
Conference proceeding

Comparing Low Coherence Interferometry with conventional methods of measuring paper roughness

Tuukka Prykari, Erkki Alarousu and Risto Myllyla
SARATOV FALL MEETING 2006: COHERENT OPTICS OF ORDERED AND RANDOM MEDIA VII, Vol.6536(1), pp.65360O-65360O-5
Proceedings of SPIE
01/01/2007
DOI: https://doi.org/10.1117/12.753459

Abstract

Optics Physical Sciences Physics Physics, Applied Physics, Condensed Matter Science & Technology
This paper introduces optical non-contact paper surface characterization based on Low Coherence Interferometry (LCI). Using this technique, the roughness of two different types of fine paper series are measured and the obtained results are compared to those of two air leak methods, PPS and Bendtsen, which are used as reference methods.

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