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DEFECT DECONVOLUTION USING 4(TH) ORDER STATISTICS FOR ULTRASONIC NONDESTRUCTIVE TESTING
Conference proceeding

DEFECT DECONVOLUTION USING 4(TH) ORDER STATISTICS FOR ULTRASONIC NONDESTRUCTIVE TESTING

Uvais Qidwai, Maamar Bettayeb, Ahmed Yamani and IEEE
ICSPC: 2007 IEEE INTERNATIONAL CONFERENCE ON SIGNAL PROCESSING AND COMMUNICATIONS, VOLS 1-3, PROCEEDINGS, pp.632-635
01/01/2007

Abstract

Computer Science Computer Science, Interdisciplinary Applications Engineering Engineering, Electrical & Electronic Science & Technology Technology Telecommunications

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