Deconvolution of ultrasonic NDT signals using N4SID algorithm for defect identification

U. Qidwai; M. Bettayeb; IEEE

doi:10.1109/ICECS.2003.1301976

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Conference proceeding

Deconvolution of ultrasonic NDT signals using N4SID algorithm for defect identification

U. Qidwai, M. Bettayeb and IEEE

10th IEEE International Conference on Electronics, Circuits and Systems, 2003. ICECS 2003. Proceedings of the 2003, Vol.1, pp.60-63 Vol.1

2003

DOI: https://doi.org/10.1109/ICECS.2003.1301976

Abstract

Additive noise

Deconvolution

Pulse measurements

Signal analysis

Signal generators

Signal processing

Signal to noise ratio

System identification

Transfer functions

Ultrasonic variables measurement

Subspace identification is considered to be one of the most powerful techniques in the system identification domain. In this paper, an application of a powerful version of subspace identification, N4SID, is presented. The target area is ultrasonic A-scans for defect detection in metals. Simulated as well as real data sets have been used for testing. Since the A-scans are a very commonly used form of analysis signals for nondestructive testing (NDT), their analysis is very useful for determining the type and severity of defect.

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Details

Title: Deconvolution of ultrasonic NDT signals using N4SID algorithm for defect identification
Creators - without role: U. Qidwai - Tulane University
M. Bettayeb
IEEE
Publication Details: 10th IEEE International Conference on Electronics, Circuits and Systems, 2003. ICECS 2003. Proceedings of the 2003, Vol.1, pp.60-63 Vol.1
Publisher: IEEE
Identifiers: 9935752508331
Academic Unit: King Abdulaziz University
Language: English
Resource Type: Conference proceeding