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Defect deconvolution using 3rd order statistics for ultrasonic Nondestructive Testing
Conference proceeding

Defect deconvolution using 3rd order statistics for ultrasonic Nondestructive Testing

Uvais Qidwai, Maamar Bettayeb, Ahmed Yamani and IEEE
2007 9TH INTERNATIONAL SYMPOSIUM ON SIGNAL PROCESSING AND ITS APPLICATIONS, VOLS 1-3, p.1314
01/01/2007

Abstract

Computer Science Computer Science, Interdisciplinary Applications Engineering Engineering, Electrical & Electronic Science & Technology Technology

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