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Dependency of electrical characteristics on nano gap variation in pinch off lateral gate transistors
Conference proceeding

Dependency of electrical characteristics on nano gap variation in pinch off lateral gate transistors

Farhad Larki, Arash Dehzangi, Sawal Hamid Md Ali, Azman Jalar, Md Shabiul Islam, Burhanuddin Y Majlis, Elias B Saion, Mohd Nizar Hamidon and Sabar D Hutagalung
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Conference Proceedings, p.170
01/08/2014

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