Abstract
We have investigated a method for solving the inverse problem of multi-layer turbid medium, from the spatially-resolved frequency-domain diffuse reflectance, based on detecting only the photons migrated within specific layer(s). According to the layers thickness, we can define a number of limiting detectors positions for each layer (d1,d2,d3,..dn), using a depth sensitivity profile, such that the detected reflectance result (with >95% confidence) from photons propagated not deep than the (1(st), 2(nd), 3(rd) ,... and n(th) layer) respectively. Thus each layer is characterized sequentially from the reflectance data confined to the corresponding detector position. We have developed a diffuse reflectance measurements apparatus and test the method experimentally on a number of two-layer phantoms. The results show that the phantoms optical properties could be deduced with errors <20% in relatively short times (<1min).