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Dielectric integrity test- a tuned circuit approach
Conference proceeding

Dielectric integrity test- a tuned circuit approach

S. Saravanan, R. Rajesh, B. Karthikeyan, S. Venkatesh and IEEE
ICPASM 2005: PROCEEDINGS OF THE 8TH INTERNATIONAL CONFERENCE ON PROPERTIES AND APPLICATIONS OF DIELECTRIC MATERIALS, VOLS 1 AND 2, pp.380-383
01/01/2006

Abstract

Engineering Engineering, Electrical & Electronic Materials Science Materials Science, Multidisciplinary Physical Sciences Physics Physics, Condensed Matter Science & Technology Technology

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