Sign in
Digital holographic microscopy applied to metrology
Conference proceeding

Digital holographic microscopy applied to metrology

Christian D Depeursinge, Florian Charriere, Anca M Marian, Frederic Montfort, Tristan Colomb, Jonas Kuhn, Etienne Cuche, Yves Emery, Pierre Marquet and Pierre J Magistretti
Proceedings of SPIE, Vol.5457(1), pp.504-512
Optical Metrology in Production Engineering
01/01/2004

Abstract

Metrics

1 Record Views

Details