Abstract
Conference Title: 2017 Conference on Lasers and Electro-Optics (CLEO) Conference Start Date: 2017, May 14 Conference End Date: 2017, May 19 Conference Location: San Jose, CA, USA We present a complete description of “topological darkness” in a three-dimensional space regarding optical constants (i.e., n and k) of effective media, wavelengths and incident angles, which is essential for enhanced light-matter interaction in thin-films.