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Dispersion topological darkness
Conference proceeding

Dispersion topological darkness

Haomin Song, Nan Zhang, Jiyuan Duan, Zhejun Liu, Jun Gao, Matthew H Singer, Dengxin Ji, Alec R Cheney, Xie Zeng, Borui Chen, …
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Conference Proceedings, p.1
01/01/2017

Abstract

Darkness Electro-optics Thin films
Conference Title: 2017 Conference on Lasers and Electro-Optics (CLEO) Conference Start Date: 2017, May 14 Conference End Date: 2017, May 19 Conference Location: San Jose, CA, USA We present a complete description of “topological darkness” in a three-dimensional space regarding optical constants (i.e., n and k) of effective media, wavelengths and incident angles, which is essential for enhanced light-matter interaction in thin-films.

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