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Doomed Run Prediction in Physical Design by Exploiting Sequential Flow and Graph Learning
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Doomed Run Prediction in Physical Design by Exploiting Sequential Flow and Graph Learning

Yi-Chen Lu, Siddhartha Nath, Vishal Khandelwal, Sung Kyu Lim and IEEE
2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD), Vol.2021-, pp.1-9
01/11/2021

Abstract

Measurement Mission critical systems Moore's Law Predictive models Productivity Semiconductor device modeling Training

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