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Dynamic characterization of intensity fluctuations in semiconductor lasers under digital modulation
Conference proceeding

Dynamic characterization of intensity fluctuations in semiconductor lasers under digital modulation

Moustafa Ahmed and Minoru Yamada
Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest 2005, pp.530-531
01/08/2005

Abstract

Bit error rate Digital modulation Fluctuation Noise Semiconductor lasers
We report on modeling of intensity fluctuations in semiconductor lasers subject to low and high speed digital modulation. We examine influence of deciding both decision and sampling times on bit-error-rate (BER). Correlation between BER and relative intensity noise (RIN) is presented.

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