Effect of Body Biasing on Embedded SRAM Failure

Amin Khajeh; Ahmed M. Eltawil; Fadi J. Kurdahi; IEEE

doi:10.1109/ISCAS.2010.5537193

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Conference proceeding

Effect of Body Biasing on Embedded SRAM Failure

Amin Khajeh, Ahmed M. Eltawil, Fadi J. Kurdahi and IEEE

2010 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, pp.2350-2353

IEEE International Symposium on Circuits and Systems

01/01/2010

DOI: https://doi.org/10.1109/ISCAS.2010.5537193

Abstract

Engineering

Engineering, Electrical & Electronic

Science & Technology

Technology

This paper studies the tradeoffs when using body biasing as a power consumption modulator for Static Random Access Memories (SRAM) in term of reliability versus power consumption. We show that for fault tolerant applications such as wireless applications and multimedia, utilizing body biasing combined with voltage scaling can result in up to 47% power saving compared to the nominal case, while, for the same scenario, utilizing only voltage scaling will result in 20% power saving in the memory compared to nominal case.

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Details

Title: Effect of Body Biasing on Embedded SRAM Failure
Creators - without role: Amin Khajeh - University of California, Irvine
Ahmed M. Eltawil - University of California, Irvine
Fadi J. Kurdahi - University of California, Irvine
IEEE
Publication Details: 2010 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, pp.2350-2353
Series: IEEE International Symposium on Circuits and Systems
Publisher: IEEE
Number of pages: 4
Identifiers: 9941980608331
Academic Unit: King Abdullah University of Science & Technology
Language: English
Resource Type: Conference proceeding