Sign in
Effect of electric field and temperature variability on spin dephasing in SiGe nanowires
Conference proceeding

Effect of electric field and temperature variability on spin dephasing in SiGe nanowires

B Bishnoi, S S Chishti, A Verma, A Salimath and B Ghosh
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Conference Proceedings, p.183
01/02/2013

Abstract

Electric fields Monte Carlo simulation

Metrics

1 Record Views

Details