Electron spin resonance study of radiation-induced point defects in nitrided and reoxidized nitrided oxides

Conference proceeding

Peer reviewed

J. T Yount, P. M Lenahan and G. J Dunn

IEEE transactions on nuclear science, Vol.39(6), pp.2211-2219

IEEE Annual International nuclear and space radiation effects conference

01/12/1992

Abstract

Applied sciences

Electronics

Exact sciences and technology

Interfaces

Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices

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Title: Electron spin resonance study of radiation-induced point defects in nitrided and reoxidized nitrided oxides
Creators - without role: J. T Yount - Pennsylvania State University
P. M Lenahan - Pennsylvania State University
G. J Dunn - American University of Rome
Publication Details: IEEE transactions on nuclear science, Vol.39(6), pp.2211-2219
Conference: IEEE Annual International nuclear and space radiation effects conference
Publisher: Institute of Electrical and Electronics Engineers
Grant note: IEEE. Nuclear and Plasma Sciences Society. Radiation Effects Committee Defense Nuclear Agency Sandia National Laboratories California Institute of Technology. Jet Propulsion Laboratory
Identifiers: 9924844608331
Academic Unit: Prince Mohammad Bin Fahd University
Language: English
Resource Type: Conference proceeding