Empirical models for net-length probability distribution and applications

Conference proceeding

Peer reviewed

Azadeh Davoodi, Vishal Khandelwal and Ankur Srivastava

IEEE transactions on very large scale integration (VLSI) systems, Vol.12(10), pp.1066-1075

01/10/2004

Abstract

Applied sciences

Design. Technologies. Operation analysis. Testing

Electronics

Exact sciences and technology

Integrated circuits

Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices

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Title: Empirical models for net-length probability distribution and applications
Creators - without role: Azadeh Davoodi - University of Maryland, College Park
Vishal Khandelwal - University of Maryland, College Park
Ankur Srivastava - University of Maryland, College Park
Publication Details: IEEE transactions on very large scale integration (VLSI) systems, Vol.12(10), pp.1066-1075
Publisher: Institute of Electrical and Electronics Engineers
Identifiers: 9943267608331
Academic Unit: King Abdullah University of Science & Technology
Language: English
Resource Type: Conference proceeding