Sign in
Enabling GSM/GPRS/EDGE EVM Testing on Low Cost Multi-Site Testers
Conference proceeding

Enabling GSM/GPRS/EDGE EVM Testing on Low Cost Multi-Site Testers

Bobby Lai, Chris Rivera, Khurram Waheed and IEEE
ITC: 2009 INTERNATIONAL TEST CONFERENCE, pp.150-156
International Test Conference Proceedings
01/01/2009

Abstract

Engineering Engineering, Electrical & Electronic Science & Technology Technology

Metrics

1 Record Views

Details