Sign in
Epistemological Metrics for models based on fractal languages of PLN
Conference proceeding

Epistemological Metrics for models based on fractal languages of PLN

D. Lopez De Luise, M. E. Marquez, C. Parraga, I. Cayla, J. Lopez Quel, J. Morelli, M. Aguero, O. Del, R. Azor, R. Aparicio, …
2016 IEEE BIENNIAL CONGRESS OF ARGENTINA (ARGENCON)
01/01/2016

Abstract

Computer Science Computer Science, Theory & Methods Engineering Engineering, Electrical & Electronic Science & Technology Technology

Metrics

1 Record Views

Details