Abstract
In current broadband MIMO-OFDM systems such as 3GPP LTE, embedded buffering memories occupy a large portion of chip area and a significant amount of power consumption. Due to the dense structure of memories, they are especially vulnerable to scaling effects such as process variation. These effects (hardware errors) become more pronounced when aggressive voltage scaling is used due to the reduced voltage overhead. To address this issue, we present an error resilient MIMO detector. First, we derive a combined distribution of the received data in a MIMO-OFDM receiver that includes both the noise incurred by the wireless channel and errors introduced at the receiver buffering memory due to aggressive voltage scaling. Using the derived distribution, a modified MIMO detection algorithm based on the tree-searching structure is presented. A case study is presented showing that the proposed approach can achieve near-optimal performance in the presence of both channel noise and memory error, while 40% to 50% of memory power savings are realized.