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Estimation of minority carrier lifetime in InGaN single junction solar cell
Conference proceeding

Estimation of minority carrier lifetime in InGaN single junction solar cell

Md Zahangir Alom, Md Soyaeb Hasan, Md Rafiqul Islam, Ibrahim Mustafa Mehedi and Abdullah M Dobaie
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Conference Proceedings, p.257
01/01/2015

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