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Event Probability Mask (EPM) and Event Denoising Convolutional Neural Network (EDnCNN) for Neuromorphic Cameras
Conference proceeding

Event Probability Mask (EPM) and Event Denoising Convolutional Neural Network (EDnCNN) for Neuromorphic Cameras

R. Wes Baldwin, Mohammed Almatrafi, Vijayan Asari, Keigo Hirakawa and IEEE
2020 IEEE/CVF CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR), pp.1698-1707
IEEE Conference on Computer Vision and Pattern Recognition
01/01/2020

Abstract

Computer Science Computer Science, Artificial Intelligence Science & Technology Technology

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