Experimental Study On The EMI And Switching Time Evolution Of IGBT Devices After Operating Aging Tests

Mohamed Tlig; Jaleleddine Ben Hadj Slama; M. A. Belaid; IEEE

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Conference proceeding

Experimental Study On The EMI And Switching Time Evolution Of IGBT Devices After Operating Aging Tests

Mohamed Tlig, Jaleleddine Ben Hadj Slama, M. A. Belaid and IEEE

2014 INTERNATIONAL CONFERENCE ON ELECTRICAL SCIENCES AND TECHNOLOGIES IN MAGHREB (CISTEM)

01/01/2014

Abstract

Engineering

Engineering, Electrical & Electronic

Engineering, Multidisciplinary

Science & Technology

Technology

The IGBT is a critical device in the static converters, it is important to assess its reliability. In this paper, we investigate the accelerated aging effect on the conducted EMI (ElectroMagnetic Interferences) evolution in the N Chanel IGBTs. We propose a new aging method applied to the IGBT switching in the buck converter circuit (chopper series type), while applying a high current, in order to achieve a junction temperature (Tj) exceeds the highest maximum value specified by the manufacturer. The conducted EMI evolution is examined and presented before and after aging tests. The measurement results show that the obtained variations after aging tests are only on the conducted EMI amplitudes.

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Title: Experimental Study On The EMI And Switching Time Evolution Of IGBT Devices After Operating Aging Tests
Creators - without role: Mohamed Tlig - University of Sousse
Jaleleddine Ben Hadj Slama - University of Sousse
M. A. Belaid - University of Sousse
IEEE
Publication Details: 2014 INTERNATIONAL CONFERENCE ON ELECTRICAL SCIENCES AND TECHNOLOGIES IN MAGHREB (CISTEM)
Publisher: IEEE
Number of pages: 5
Identifiers: 9930533308331
Academic Unit: Umm Al Qura University
Language: English
Resource Type: Conference proceeding