A. Almaiman - Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA, USA
M. Ziyadi - Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA, USA
A. Mohajerin-Ariaei - Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA, USA
Y. Cao - Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA, USA
M. R. Chitgarha - Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA, USA
P. Liao - Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA, USA
Y. Akasaka - Fujitsu
J.-Y Yang - Fujitsu Labs. of America, Richardson, TX, USA
J. Touch - Inf. Sci. Inst., Univ. of Southern California, Marina del Rey, CA, USA
M. Sekiya - Fujitsu
C. Langrock - Stanford University
M. M. Fejer - Stanford University
M. Tur - Tel Aviv University
A. E. Willner - Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA, USA
IEEE