A. Fallahpour - Ming Hsieh Department of Electrical Engineering, University of Southern California, 3740 McClintock Ave, Los Angeles, CA 90089, USA
M. Ziyadi - Ming Hsieh Department of Electrical Engineering, University of Southern California, 3740 McClintock Ave, Los Angeles, CA 90089, USA
A. Mohajerin-Ariaei - Ming Hsieh Department of Electrical Engineering, University of Southern California, 3740 McClintock Ave, Los Angeles, CA 90089, USA
Y. Cao - Ming Hsieh Department of Electrical Engineering, University of Southern California, 3740 McClintock Ave, Los Angeles, CA 90089, USA
A. Almaiman - Ming Hsieh Department of Electrical Engineering, University of Southern California, 3740 McClintock Ave, Los Angeles, CA 90089, USA
F. Alishahi - Ming Hsieh Department of Electrical Engineering, University of Southern California, 3740 McClintock Ave, Los Angeles, CA 90089, USA
C. Bao - Ming Hsieh Department of Electrical Engineering, University of Southern California, 3740 McClintock Ave, Los Angeles, CA 90089, USA
P. Liao - Ming Hsieh Department of Electrical Engineering, University of Southern California, 3740 McClintock Ave, Los Angeles, CA 90089, USA
B. Shamee - Ming Hsieh Department of Electrical Engineering, University of Southern California, 3740 McClintock Ave, Los Angeles, CA 90089, USA
L. Paraschis - Infinera
M. Tur - Tel Aviv University
C. Langrock - Stanford University
M. M. Fejer - Stanford University
J. Touch - Information Sciences Institute, University of Southern California, 4676 Admiralty Way, Marina del Rey, CA, 90292, USA
A. E. Willner - Ming Hsieh Department of Electrical Engineering, University of Southern California, 3740 McClintock Ave, Los Angeles, CA 90089, USA
IEEE