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Fast and Low-Cost Mitigation of ReRAM Variability for Deep Learning Applications
Conference proceeding

Fast and Low-Cost Mitigation of ReRAM Variability for Deep Learning Applications

Sugil Lee, Mohammed Fouda, Jongeun Lee, Ahmed Eltawil, Fadi Kurdahi and IEEE COMP SOC
2021 IEEE 39th International Conference on Computer Design (ICCD), Vol.2021-, pp.269-276
01/01/2021

Abstract

Artificial Neural Networks (ANNs) Batch Normalization Conferences Deep learning Hardware Programming ReRAM Cross-bar Array Software Systematics Training Write Variability

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