Fast modeling of conducted EMI phenomena using improved classical models

Leila Fakhfakh; Abdulrahman Alahdal; Anis Ammous

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Fast modeling of conducted EMI phenomena using improved classical models

Leila Fakhfakh, Abdulrahman Alahdal and Anis Ammous

The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Conference Proceedings, Vol.1, p.549

01/01/2016

Abstract

Conference Title: 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) Conference Start Date: 2016, May 17 Conference End Date: 2016, May 21 Conference Location: Shenzhen, China In this paper, a simplified analytical frequency model of conducted EMI generated by a DC/DC converter is proposed. The methodology is based on the relationship between the noise source and the propagation path. The effect of the parasitic elements was taken into account in the noise sources waveforms. The proposed method was verified by comparing the improved models results with the time domain simulation results using Saber® simulation tool.

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Title: Fast modeling of conducted EMI phenomena using improved classical models
Creators - without role: Leila Fakhfakh
Abdulrahman Alahdal
Anis Ammous
Publication Details: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Conference Proceedings, Vol.1, p.549
Publisher: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Identifiers: 9931642008331
Academic Unit: Umm Al Qura University
Language: English
Resource Type: Conference proceeding