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Fringe pattern analysis using a one-dimensional modified Morlet continuous wavelet transform
Conference proceeding

Fringe pattern analysis using a one-dimensional modified Morlet continuous wavelet transform

Abdulbasit Z. Abid, Munther A. Gdeisat, David R. Burton, Michael J. Lalor, Hussein S. Abdul-Rahman and Francis Lilley
OPTICAL AND DIGITAL IMAGE PROCESSING, Vol.7000(1), pp.70000Q-70000Q-6
Proceedings of SPIE
01/01/2008

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Imaging Science & Photographic Technology Optics Physical Sciences Science & Technology Technology

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