Abstract
We have grown epitaxial Y2O3 buffer layers on biaxially textured Ni-W substrates using a newly developed metal organic decomposition (MOD) approach. Precursor solution of 0.25M concentration was spin coated on short samples of Ni-3 at.%W (Ni-W) substrates and heat-treated at 1150degreesC in a gas Mixture of Ar-4%H-2 for an hour. Detailed X-Ray studies indicate that Y2O3 films has good out-of-plane and in-plane textures with full-width-half-maximum values of 6.22degrees and 7.51degrees, respectively. SEM investigations of Y2O3 films reveal a fairly dense microstructure Without cracks and porosity. It is possible to use this MOD Y2O3 template for growing high current density YBCO films.