High spatial resolution elemental analysis with a 300kV FE-TEM: MATERIALS SCIENCE 2

Conference proceeding

High spatial resolution elemental analysis with a 300kV FE-TEM: MATERIALS SCIENCE 2

ELECTRON MICROSCOPY 1998, VOL 3, pp.571-572

01/01/1998

Abstract

Chemistry

Chemistry, Physical

Materials Science

Materials Science, Biomaterials

Materials Science, Multidisciplinary

Microscopy

Physical Sciences

Science & Technology

Technology

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Title: High spatial resolution elemental analysis with a 300kV FE-TEM
Creators - without role: Y Bando
Contributors - without role: HAC Benavides
M J Yacaman
Publication Details: ELECTRON MICROSCOPY 1998, VOL 3, pp.571-572
Publisher: Iop Publishing Ltd
Number of pages: 2
Identifiers: 9952558208331
Academic Unit: King Saud University
Language: English
Resource Type: Conference proceeding