Abstract
Conference Title: 2014 11th International Multi-Conference on Systems, Signals & Devices (SSD) Conference Start Date: 2014, Feb. 11 Conference End Date: 2014, Feb. 14 Conference Location: Castelldefels-Barcelona, Spain Visual Evoked Potentials (VEPs) are referred to electrical potentials due to brief visual stimuli which can be recorded from scalp overlying visual cortex. A way to measure VEPs is through encephalogram (EEG). VEPs are very important because they can quantify functional integrity of the optic pathway. Their study allows to detect abnormalities that affect the visual pathways or visual cortex in the brain, and so methods that permit to identify VEPs components in EEG signals must be defined. However, the background activity measured from EEG hides VEPs components because they have a low voltage. So it is necessary to define a robust method to extract features, which best describe these potentials of interest. In this work Empirical Mode Decomposition (EMD) method is used to separate the EEG components and to detect VEPs. EMD decomposes a signal into components named Intrinsic Mode Functions (IFM). The results, obtained from the study of EEG records of a normal person, suggest that IMFs may be used to determine VEPs in EEG and to obtain important information related to brain activity by a time and frequency analysis of IMF components. It is well comparable with the known Wavelet Transform method, but it is characterized from a greater simplicity of implementation because the basis used in the analysis is generated by the same analyzed signal. [PUBLICATION ABSTRACT]