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In-situ TEM electrical and mechanical properties measurements of one-dimensional inorganic nanomaterials
Conference proceeding

In-situ TEM electrical and mechanical properties measurements of one-dimensional inorganic nanomaterials

D. Golberg, P. M. F. J. Costa, M. Mitome, Y. Bando and IEEE
2008 2ND IEEE INTERNATIONAL NANOELECTRONICS CONFERENCE, VOLS 1-3, pp.1127-1131
01/01/2008
DOI: https://doi.org/10.1109/INEC.2008.4585680

Abstract

Engineering Engineering, Electrical & Electronic Nanoscience & Nanotechnology Science & Technology Science & Technology - Other Topics Technology
The unique possibilities of Current-Voltage (I-V) and Force-Displacement (F-D) curve recordings from individual 1D-nanostructures Inside high-resolution transmission electron microscopes are demonstrated. The examples Include Ga-filled MgO, In-filled SiO2 and pure multi-walled BN nanotubes.

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