Intrinsic characteristics of high-k devices and implications of fast transient charging effects (FTCE)

B. H Lee; C. D Young; N Moumen; J Bamett; P Lysaght; K. S Choi; H. C Wen; C Huffinan; H Alshareef; P Majhi; S Gopalan; J Peterson; R Choi; P Kirsh; H.-J LI; J Gutt; M Gardner; H. R Huff; P Zeitzoff; R. W Murto; L Larson; C Ramiller; J. H Sim; G Bersuker; C. Y Kang; R Harris; G. A Brown; K Matthews; S. C Song; ieee

doi:10.1109/IEDM.2004.1419314

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Intrinsic characteristics of high-k devices and implications of fast transient charging effects (FTCE)

B. H Lee, C. D Young, N Moumen, J Bamett, P Lysaght, K. S Choi, H. C Wen, C Huffinan, H Alshareef, P Majhi, …

IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004, pp.859-862

IEEE International Electron Devices Meeting 2004 (IEDM technical digest)

2004

DOI: https://doi.org/10.1109/IEDM.2004.1419314

Abstract

Applied sciences

Electronics

Exact sciences and technology

Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices

Transistors

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Title: Intrinsic characteristics of high-k devices and implications of fast transient charging effects (FTCE)
Creators - without role: B. H Lee - IBM Research - Austin
C. D Young - IBM Research - Austin
N Moumen - IBM Research - Austin
J Bamett - IBM, assignee 2706 Montopolis Drive, Austin, TX 78741, United States
P Lysaght - IBM Research - Austin
K. S Choi - IBM, assignee 2706 Montopolis Drive, Austin, TX 78741, United States
H. C Wen - IBM Research - Austin
C Huffinan - IBM, assignee 2706 Montopolis Drive, Austin, TX 78741, United States
H Alshareef - IBM
P Majhi - Philips
S Gopalan - Philips
J Peterson - IBM Research - Austin
R Choi - IBM Research - Austin
P Kirsh - IBM Research - Austin
H.-J LI - Infinera
J Gutt - IBM Research - Austin
M Gardner - Philips
H. R Huff - IBM Research - Austin
P Zeitzoff - IBM Research - Austin
R. W Murto - TI, assignee 2706 Montopolis Drive, Austin, TX 78741, United States
L Larson - Sematech
C Ramiller - IBM Research - Austin
J. H Sim - IBM Research - Austin
G Bersuker - IBM Research - Austin
C. Y Kang - IBM Research - Austin
R Harris - IBM Research - Austin
G. A Brown - IBM Research - Austin
K Matthews - IBM Research - Austin
S. C Song - IBM, assignee 2706 Montopolis Drive, Austin, TX 78741, United States
ieee
Publication Details: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004, pp.859-862
Conference: IEEE International Electron Devices Meeting 2004 (IEDM technical digest)
Publisher: IEEE
Identifiers: 9944277108331
Academic Unit: King Abdullah University of Science & Technology
Language: English
Resource Type: Conference proceeding