Local phonon analysis in InGaN film by mapping of Raman peak energy

Conference proceeding

Shungo Okamoto, Naomichi Saito, Bei Ma, Kensuke Oki, Ken Morita, Kazuhiro Ohkawa, Yoshihiro Ishitani and IEEE

2019 COMPOUND SEMICONDUCTOR WEEK (CSW)

01/01/2019

Abstract

Engineering

Engineering, Electrical & Electronic

Materials Science

Materials Science, Multidisciplinary

Science & Technology

Technology

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Title: Local phonon analysis in InGaN film by mapping of Raman peak energy
Creators - without role: Shungo Okamoto - Chiba University
Naomichi Saito - Chiba University
Bei Ma - Chiba University
Kensuke Oki - Chiba University
Ken Morita - Chiba University
Kazuhiro Ohkawa - King Abdullah Univ Sci & Technol, Comp Elect & Math Sci & Engn Div, Thuwal, Saudi Arabia
Yoshihiro Ishitani - Chiba University
IEEE
Publication Details: 2019 COMPOUND SEMICONDUCTOR WEEK (CSW)
Publisher: IEEE
Number of pages: 1
Identifiers: 9943843508331
Academic Unit: King Abdullah University of Science & Technology
Language: English
Resource Type: Conference proceeding