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Mining fault tolerant frequent patterns using pattern growth approach
Conference proceeding

Mining fault tolerant frequent patterns using pattern growth approach

Shariq Bashir, Zahid Halim, A. Rauf Baig and IEEE
2008 IEEE/ACS INTERNATIONAL CONFERENCE ON COMPUTER SYSTEMS AND APPLICATIONS, VOLS 1-3, pp.172-179
International Conference on Computer Systems and Applications
01/01/2008

Abstract

Computer Science Computer Science, Artificial Intelligence Computer Science, Hardware & Architecture Computer Science, Information Systems Computer Science, Interdisciplinary Applications Computer Science, Software Engineering Computer Science, Theory & Methods Life Sciences & Biomedicine Mathematical & Computational Biology Science & Technology Technology Telecommunications

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