Abstract
Given the increasing demand for integrated wireless systems in system-on -chip technology, narrow-band low, noise amplifier (LNA) designs must be robust against variations in device parameters and passive component values to improve manufacturing yield for high volume applications. In this paper we develop two design techniques for reducing the impact of component variations on narrow-band LNA performance. The results demonstrate that by increasing the bandwidth of the narrow-band LNA and applying more conservative design constraints, we can mitigate the reliability implications of process variations on impedance matching, gain, and power Consumption to significantly increase yield in integrated wireless applications.